-
GB/T 43612-2023 in English
Collection of metallographs on defects in silicon carbide crystal materials
valid
Issued on:2023-12-28
$1,372.00 -
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GB/T 16595-2019 in English
Specification for a universal wafer grid
valid
Issued on:2019-03-25
$116.00 -
GB/T 16596-2019 in English
Specification for establishing a wafer coordinate system
valid
Issued on:2019-03-25
$116.00 -
GB/T 8756-2018 in English
Collection of metallographs on defects of germanium crystal
valid
Issued on:2018-12-28
$1,148.00 -
GB/T 37051-2018 in English
Test method for determination of crystal defect density in PV silicon ingot and wafer
valid
Issued on:2018-12-28
$256.00 -
GB/T 14844-2018 in English
Designations of semiconductor materials
valid
Issued on:2018-12-28
$308.00 -
GB/T 34479-2017 in English
Specification for alphanumeric marking of silicon wafers
valid
Issued on:2017-10-14
$336.00 -
GB/T 32279-2015 in English
pecification for order entry format of silicon wafers
valid
Issued on:2015-12-10
$432.00 -